OGI Systems Group will be launching ClearEX - a new advanced system to detect inclusions, says a report.

The new device is to be launched at the India Gem & Jewelry Machinery Expo 2014, at IGJME Expo Booth 97, in Surat. The new device has been developed after extensive research and development for detection and mapping of internal features in rough diamonds. The ClearEX can scan most rough diamonds and accurately detect all the inclusions in the stone, adds report.

The India Gem & Jewelry Machinery Expo 2014 will be taking place during 28-30 November 2014, in Surat.