The new GalaxyTM Ultra offers manufacturers the advantage of inclusion scanning of the rough diamond at microscope level magnification, in addition to the normal scanning executed by the standard GalaxyTM systems. This allows detection of inclusions with single-micron resolution, including the detection of clouds of inclusions of single micron size.

As such, seemingly clean areas of rough diamonds can be inspected with extra-high accuracy and users can more confidently determine whether they can achieve an Internally Flawless (IF) Clarity grade. The scanning, detection and inclusion mapping on the Ultra are fully automatic, even at such high level of resolution, unlike alternative solutions that involve manual methods and use of a microscope, micron layer by micron layer.

“With its introduction, manufacturers can now take advantage of the Galaxy'sTM unique characteristics - its execution of comprehensive inclusion mapping, automatically and at unmatched speeds, and also benefit from microscope-level resolution and accuracy.” said Uzi Levami, Sarin’s Executive Director and CEO. “We believe that Sarin’s customers will significantly benefit from the new capabilities offered by the Ultra, as they will be able to truly optimize the quality and value of the polished diamonds they produce from their high quality rough stones and more confidently achieve far more finished diamonds with IF and VVS Clarity grades,.”

Service of the GalaxyTM Ultra at additional service centres will follow, as per demand. Sales and delivery of GalaxyTM Ultra systems to interested customers is expected later in 2014.