OGI Systems introduces Symmetry Leakage technology

OGI Systems Ltd. has created a new technology is a symmetry analysis and evaluation technology for polished diamonds, known as the Symmetry Leakage. It intends to launch this technology t the upcoming AGS International Conclave, April 22-25, 2015 at the Marriott New Orleans in New Orleans, Louisiana.

The Symmetry Leakage technology can predict symmetry leakage in a single impression. This advanced technology measures the symmetry of polished diamonds according to the light reflection of the stone. It brings the diamond grading system to a high-quality level of measurement. Within a few seconds, the system provides all symmetry parameters, facet points and grading results.

In addition, the Symmetry Leakage rates the diamonds based on its anatomical structure. This guarantees an objective observation. The technology helps gemologists avoid the need to rate diamond symmetry.

A final patent process is underway for the Symmetry Leakage technology. The technology was developed after extensive research conducted in laboratories around the world.